Reliable Measurements of Interfacial Slip by Colloid Probe Atomic Force Microscopy. I. Mathematical Modeling

Title
Reliable Measurements of Interfacial Slip by Colloid Probe Atomic Force Microscopy. I. Mathematical Modeling
Authors
Keywords
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Journal
LANGMUIR
Volume 27, Issue 11, Pages 6701-6711
Publisher
American Chemical Society (ACS)
Online
2011-05-04
DOI
10.1021/la2007809

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