Comparative Height Measurements of Dip-Pen Nanolithography-Produced Lipid Membrane Stacks with Atomic Force, Fluorescence, and Surface-Enhanced Ellipsometric Contrast Microscopy

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Title
Comparative Height Measurements of Dip-Pen Nanolithography-Produced Lipid Membrane Stacks with Atomic Force, Fluorescence, and Surface-Enhanced Ellipsometric Contrast Microscopy
Authors
Keywords
-
Journal
LANGMUIR
Volume 27, Issue 18, Pages 11605-11608
Publisher
American Chemical Society (ACS)
Online
2011-08-04
DOI
10.1021/la202703j

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