Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector

Published 2010 View Full Article

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Title
Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector
Authors
Keywords
-
Journal
LANGMUIR
Volume 26, Issue 11, Pages 9146-9151
Publisher
American Chemical Society (ACS)
Online
2010-04-02
DOI
10.1021/la904840q

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