Determination of deep-level defects in Cu2ZnSn(S,Se)4 thin-films using photocapacitance method
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Title
Determination of deep-level defects in Cu2ZnSn(S,Se)4 thin-films using photocapacitance method
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 24, Pages 243905
Publisher
AIP Publishing
Online
2015-06-18
DOI
10.1063/1.4922810
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