A framework for assessing amorphous oxide semiconductor thin-film transistor passivation

Passivation of Amorphous Oxide Semiconductors Utilizing a Zinc–Tin–Silicon–Oxide Barrier Layer

(2012) E. S. Sundholm et al.   IEEE ELECTRON DEVICE LETTERS

Metal-induced gap states modeling of metal-Ge contacts with and without a silicon nitride ultrathin interfacial layer

(2011) John F. Wager et al.   JOURNAL OF APPLIED PHYSICS

Comprehensive studies of the degradation mechanism in amorphous InGaZnO transistors by the negative bias illumination stress

(2011) Kwang Hwan Ji et al.   MICROELECTRONIC ENGINEERING

Present status of amorphous In–Ga–Zn–O thin-film transistors

(2010) Toshio Kamiya et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

pin double-heterojunction thin-film solar cell p-layer assessment

(2009) J.A. Spies et al.   SOLAR ENERGY MATERIALS AND SOLAR CELLS

Transparent electronics: Schottky barrier and heterojunction considerations

(2007) J.F. Wager   THIN SOLID FILMS