期刊
APPLIED PHYSICS LETTERS
卷 106, 期 1, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4905368
关键词
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资金
- Air Force Office of Scientific Research [FA9550-12-1-0456]
- State of North Carolina
- National Science Foundation
Here, we apply revolving scanning transmission electron microscopy to measure lattice strain across a sample using a single reference area. To do so, we remove image distortion introduced by sample drift, which usually restricts strain analysis to a single image. Overcoming this challenge, we show that it is possible to use strain reference areas elsewhere in the sample, thereby enabling reliable strain mapping across large areas. As a prototypical example, we determine the strain present within the microstructure of a Ni-based superalloy directly from atom column positions as well as geometric phase analysis. While maintaining atomic resolution, we quantify strain within nanoscale regions and demonstrate that large, unit-cell level strain fluctuations are present within the intermetallic phase. (C) 2015 AIP Publishing LLC.
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