Focused ion beam (FIB) combined with high resolution scanning electron microscopy: A promising tool for 3D analysis of chromosome architecture

Published 2008 View Full Article

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Title
Focused ion beam (FIB) combined with high resolution scanning electron microscopy: A promising tool for 3D analysis of chromosome architecture
Authors
Keywords
-
Journal
JOURNAL OF STRUCTURAL BIOLOGY
Volume 165, Issue 2, Pages 97-106
Publisher
Elsevier BV
Online
2008-11-08
DOI
10.1016/j.jsb.2008.10.002

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