Focused ion beam (FIB) combined with high resolution scanning electron microscopy: A promising tool for 3D analysis of chromosome architecture

标题
Focused ion beam (FIB) combined with high resolution scanning electron microscopy: A promising tool for 3D analysis of chromosome architecture
作者
关键词
-
出版物
JOURNAL OF STRUCTURAL BIOLOGY
Volume 165, Issue 2, Pages 97-106
出版商
Elsevier BV
发表日期
2008-11-08
DOI
10.1016/j.jsb.2008.10.002

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