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Title
Nanoscale intermittent contact-scanning electrochemical microscopy
Authors
Keywords
SECM, Nanoelectrode, Nanoscale electrochemical imaging, Focused ion beam (FIB) milling
Journal
JOURNAL OF SOLID STATE ELECTROCHEMISTRY
Volume 17, Issue 12, Pages 2979-2987
Publisher
Springer Nature
Online
2013-07-27
DOI
10.1007/s10008-013-2168-2
References
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