Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 121, Issue 3, Pages 1243-1250Publisher
SPRINGER HEIDELBERG
DOI: 10.1007/s00339-015-9496-2
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Funding
- Danish Strategic Research Council from NEXIM project
- CIA-CT project
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We present a new method for detecting fractures in solid materials below the resolution given by the detector pixel size by using grating-based X-ray interferometry. The technique is particularly useful for detecting sub-pixel cracks in large samples where the size of the sample is preventing high-resolution mu CT studies of the entire sample. The X-ray grating interferometer produces three distinct modality signals: absorption, phase and dark field. The method utilizes the unique scattering features of the dark-field signal. We have used tomograms reconstructed from each of the three signals to detect cracks in a model sample consisting of stearin.
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