Study of the resistive switching of vertically aligned carbon nanotubes by scanning tunneling microscopy

Published 2015 View Full Article

Authors

Keywords

Electric Field Strength, Scan Tunneling Micro, External Electric Field, Resistive Switching, Scan Tunneling Micro Image

Journal

PHYSICS OF THE SOLID STATE

Volume 57, Issue 4, Pages 825-831

Publisher

Pleiades Publishing Ltd

Online

2015-04-15

DOI

10.1134/s1063783415040034

References

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