Study of the resistive switching of vertically aligned carbon nanotubes by scanning tunneling microscopy

标题
Study of the resistive switching of vertically aligned carbon nanotubes by scanning tunneling microscopy
作者
关键词
Electric Field Strength, Scan Tunneling Micro, External Electric Field, Resistive Switching, Scan Tunneling Micro Image
出版物
PHYSICS OF THE SOLID STATE
Volume 57, Issue 4, Pages 825-831
出版商
Pleiades Publishing Ltd
发表日期
2015-04-15
DOI
10.1134/s1063783415040034

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