Trapping of majority carriers in SiO2/4H-SiC structures

Published 2009 View Full Article

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Title
Trapping of majority carriers in SiO2/4H-SiC structures
Authors
Keywords
-
Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 42, Issue 12, Pages 125301
Publisher
IOP Publishing
Online
2009-05-22
DOI
10.1088/0022-3727/42/12/125301
References
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