Understanding Copper Activation and Xanthate Adsorption on Sphalerite by Time-of-Flight Secondary Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and in Situ Scanning Electrochemical Microscopy

Published 2013 View Full Article

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Title
Understanding Copper Activation and Xanthate Adsorption on Sphalerite by Time-of-Flight Secondary Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and in Situ Scanning Electrochemical Microscopy
Authors
Keywords
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Journal
Journal of Physical Chemistry C
Volume 117, Issue 39, Pages 20089-20097
Publisher
American Chemical Society (ACS)
Online
2013-09-07
DOI
10.1021/jp407795k

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