Understanding Copper Activation and Xanthate Adsorption on Sphalerite by Time-of-Flight Secondary Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and in Situ Scanning Electrochemical Microscopy

标题
Understanding Copper Activation and Xanthate Adsorption on Sphalerite by Time-of-Flight Secondary Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and in Situ Scanning Electrochemical Microscopy
作者
关键词
-
出版物
Journal of Physical Chemistry C
Volume 117, Issue 39, Pages 20089-20097
出版商
American Chemical Society (ACS)
发表日期
2013-09-07
DOI
10.1021/jp407795k

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