Quantitative analysis of electrically detected Ramsey fringes in P-doped Si

Title
Quantitative analysis of electrically detected Ramsey fringes in P-doped Si
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 92, Issue 16, Pages -
Publisher
American Physical Society (APS)
Online
2015-10-14
DOI
10.1103/physrevb.92.165310

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