The role of the local chemical environment of Ag on the resistive switching mechanism of conductive bridging random access memories

Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices

(2014) Umberto Celano et al.   NANO LETTERS

Physical origins and suppression of Ag dissolution in GeSx-based ECM cells

(2014) Jan van den Hurk et al.   PHYSICAL CHEMISTRY CHEMICAL PHYSICS

Studying the surface reaction between NiO and Al2O3viatotal reflection EXAFS (ReflEXAFS)

(2014) Tommaso Costanzo et al.   JOURNAL OF SYNCHROTRON RADIATION

Nanoscale resistive switching devices: mechanisms and modeling

(2013) Yuchao Yang et al.   Nanoscale

On the impact of Ag doping on performance and reliability of GeS2-based conductive bridge memories

(2013) F. Longnos et al.   SOLID-STATE ELECTRONICS

Direct Observation of Charge Transfer in Solid Electrolyte for Electrochemical Metallization Memory

(2012) Deok-Yong Cho et al.   ADVANCED MATERIALS

Observation of conducting filament growth in nanoscale resistive memories

(2012) Yuchao Yang et al.   Nature Communications

Electrochemical metallization memories—fundamentals, applications, prospects

(2011) Ilia Valov et al.   NANOTECHNOLOGY

Controllable Growth of Nanoscale Conductive Filaments in Solid-Electrolyte-Based ReRAM by Using a Metal Nanocrystal Covered Bottom Electrode

(2010) Qi Liu et al.   ACS Nano

Formation and Instability of Silver Nanofilament in Ag-Based Programmable Metallization Cells

(2010) Chang-Po Hsiung et al.   ACS Nano

Back-end-of-line compatible Conductive Bridging RAM based on Cu and SiO2

(2010) Y. Bernard et al.   MICROELECTRONIC ENGINEERING

Demonstration of Conductive Bridging Random Access Memory (CBRAM) in logic CMOS process

(2010) C. Gopalan et al.   SOLID-STATE ELECTRONICS

Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges

(2009) Rainer Waser et al.   ADVANCED MATERIALS

Structural development in Ge-rich Ge–S glasses

(2009) Y. Sakaguchi et al.   JOURNAL OF NON-CRYSTALLINE SOLIDS

Selection of Optimized Materials for CBRAM Based on HT-XRD and Electrical Test Results

(2009) Rainer Bruchhaus et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

A new procedure for the quantitative analysis of extended x-ray absorption fine structure data in total reflection geometry

(2008) F. Benzi et al.   REVIEW OF SCIENTIFIC INSTRUMENTS