NanoSIMS imaging of Bacillus spores sectioned by focused ion beam

Title
NanoSIMS imaging of Bacillus spores sectioned by focused ion beam
Authors
Keywords
-
Journal
JOURNAL OF MICROSCOPY
Volume 238, Issue 3, Pages 189-199
Publisher
Wiley
Online
2009-10-28
DOI
10.1111/j.1365-2818.2009.03336.x

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started