NanoSIMS imaging of Bacillus spores sectioned by focused ion beam

标题
NanoSIMS imaging of Bacillus spores sectioned by focused ion beam
作者
关键词
-
出版物
JOURNAL OF MICROSCOPY
Volume 238, Issue 3, Pages 189-199
出版商
Wiley
发表日期
2009-10-28
DOI
10.1111/j.1365-2818.2009.03336.x

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