Article
Construction & Building Technology
Zhilu Jiang, Yingjie Pan, Chuanqing Fu, Weiwen Li, Yaocheng Wang, Wu-Jian Long
Summary: This paper aims to investigate the 3-D pore structure of cement paste at different scales using XCT and FIB/SEM. The results show that pore structures measured by FIB/SEM are more heterogeneous than those measured by XCT. Additionally, the pore connectivity decreases with decreasing water-cement ratio, increasing curing age, and the addition of fly ash/slag. The reduction in connectivity due to fly ash is more significant based on the observations by XCT compared to FIB/SEM. The transport-related tortuosity differs from geometric tortuosity, and the diffusional tortuosity exhibits a larger discrepancy from hydraulic tortuosity at lower porosity.
CONSTRUCTION AND BUILDING MATERIALS
(2023)
Article
Chemistry, Multidisciplinary
Oleksandr Buchnev, James A. Grant-Jacob, Robert W. Eason, Nikolay I. Zheludev, Ben Mills, Kevin F. MacDonald
Summary: Researchers have developed a deep learning method based on prior experience to predict the postfabrication appearance of structures manufactured by focused ion beam (FIB) milling, which can expedite the optimization process and improve reproducibility in FIB processing.
Article
Materials Science, Multidisciplinary
Xi Lin, Chen Fang, Haoyang Liu, Guorong Wu, Yan Xing
Summary: With the development of manufacturing technology of micro/nano devices based on GaN, focused gallium ion beam has become a significant method for machining complex GaN structures. This study focuses on the characterization and simulation of sputtering etched profile by Ga FIB on GaN substrate. The experimental results indicate that the sputtering etched regularity on GaN substrate differs from that on Si substrate, especially in terms of redeposition effect, milling rate, and droplet phenomenon. The forming mechanism of droplet phenomenon is discussed, and the impact of ion dose and dwelling time on droplet appearance is explored. The sputtering yield of GaN under focused gallium ion beam is measured, sorted, and a simulation program based on continuous cellular automaton (CCA) model is developed.
MATERIALS & DESIGN
(2022)
Article
Biochemistry & Molecular Biology
Nikita Shandyba, Sergey Balakirev, Vladislav Sharov, Natalia Chernenko, Danil Kirichenko, Maxim Solodovnik
Summary: This paper presents experimental studies on the effect of Ga-focused ion beam (FIB) surface modification on Si(111) on the growth of GaAs nanowires (NWs). The authors observed three different modes of surface features on the GaAs NW growth based on the dose of Ga ions during surface modification. At low doses, NW growth is suppressed, while high-density GaAs NW arrays with a high fraction of vertically aligned nanowires are achieved at medium doses. At high doses, a continuous polycrystalline base with misoriented and thin GaAs NWs is formed. The interaction between the implanted Ga ions and the surface plays a key role in the modification and growth processes.
INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES
(2023)
Article
Chemistry, Physical
Deying Xia, Ying-Bing Jiang, John Notte, Doug Runt
Summary: This study compares the usage of a neon focused ion beam with the traditional gallium focused ion beam for milling GaAs material, finding that neon FIB produces less undesired artifacts and subsurface damage at lower energies. Additionally, neon FIB can create trenches as small as 20 nm wide with high fidelity and minimal damage.
APPLIED SURFACE SCIENCE
(2021)
Article
Nanoscience & Nanotechnology
Nikita Shandyba, Danil Kirichenko, Vladislav Sharov, Natalia Chernenko, Sergey Balakirev, Maxim Solodovnik
Summary: A novel phenomenon is revealed after self-catalytic growth of GaAs nanowires (NWs) on Ga focused ion beam (FIB) treated Si(111) substrates. The growth of GaAs NWs and nanocrystals is suppressed at an ion dose of around 0.1 pCμm-2, but further increase in ion dose stimulates crystal growth, leading to the formation of extremely thin NWs with a high surface density.
Article
Materials Science, Multidisciplinary
Hongliang Liu, Zhiying Guo, Xiaofeng Yuan, Zunwei Zhu, Qianqian Gao, Xin Zhang
Summary: Field emission tip arrays (nanoFEAs) with sub-100 nm apices on single crystal cerium hexaboride (CeB6) surface were fabricated using focused ion beam (FIB) milling microtechnology. The surface morphology and field emission properties of the nanoFEAs were systematically characterized. The nanoFEAs, with sharp tips of approximately 50 nm in size, exhibited the lowest turn-on electric fields (2.0 V/μm), high current (>1 mA) at 6.7 V/μm, and stable emission current, making them promising candidates for field emission electronics applications.
FUNCTIONAL MATERIALS LETTERS
(2023)
Article
Chemistry, Multidisciplinary
Yanran Liu, Yuanyuan Qu, Yue Liu, Hang Yin, Jinglun Liu, Yang Tan, Feng Chen
Summary: This study demonstrates the construction of lateral diodes on graphene-based heterostructures using focused ion-beam writing, achieving rectification and current regulating functions. The introduction of Se-defects endows the heterostructure with unique electronic properties, enabling the construction of diodes with comparable performance. Additionally, AND and OR logic gates were directly inscribed on the heterostructure to showcase practical applications in digital logic electronics.
ADVANCED FUNCTIONAL MATERIALS
(2021)
Article
Chemistry, Multidisciplinary
Shuai Jiang, Volkan Ortalan
Summary: The milling profiles of single-crystal gallium nitride (GaN) subjected to focused ion beams (FIBs) were investigated using different ion sources. The experimental and simulation approaches enhanced the understanding of FIB milling dynamics and its application in nanostructure fabrication.
Article
Chemistry, Physical
Piotr Tatarczak, Henryk Turski, Krzysztof P. Korona, Ewa Grzanka, Czeslaw Skierbiszewski, Andrzej Wysmolek
Summary: Detailed comparison of optical quality of GaN layers grown homoepitaxially on bulk Ga-polar and N-polar substrates by plasma-assisted molecular beam epitaxy was conducted. Layers grown on N-polar substrates showed one order of magnitude lower photo-luminescence intensity and decay time due to gallium-rich conditions, while nitrogen-rich growth conditions greatly improved the optical quality by suppressing formation of nitrogen vacancy-related point defects. Layers grown on N-polar substrates achieved linewidth below 1 meV and lifetime above 0.1 ns at He temperature.
APPLIED SURFACE SCIENCE
(2021)
Article
Chemistry, Multidisciplinary
Andrew C. Madison, John S. Villarrubia, Kuo-Tang Liao, Craig R. Copeland, Joshua Schumacher, Kerry Siebein, B. Robert Ilic, J. Alexander Liddle, Samuel M. Stavis
Summary: This article focuses on the study of the fundamental tradespace of resolution and throughput in focused-ion-beam machining. By using chromia and silica as materials, complex test structures were fabricated and characterized to explore the response of the bilayer to a focused beam of gallium cations. The results showed a super-resolution factor of up to 6+/-2 and improvements to volume throughput of at least factors of 42+/-2.
ADVANCED FUNCTIONAL MATERIALS
(2022)
Article
Chemistry, Multidisciplinary
Deying Xia, John Notte
Summary: 3D nanostructures are crucial for creating custom devices with unique functionalities. This study presents a method using ion beams to induce bending and folding in membranes, resulting in the formation of nano-kirigamis with controlled angles and directions. The approach involves milling 2D patterns into the membrane using helium or neon ion beams, followed by broad and uniform irradiation using gallium ion beams to induce out-of-plane bending. This technique allows for the fabrication of complex 3D nanostructures and branched nanowires.
ADVANCED MATERIALS INTERFACES
(2022)
Article
Chemistry, Physical
Xiaohui He, Panpan Wu, Xin Huang, Chaohua Dai, Changshun Li, Longjiu Cheng, Tonglai Zhang, Jianguo Zhang, Kun Wang
Summary: This study used DFT and Car-Parrinello molecular dynamics to investigate the electronic structures and decomposition pathways of metallic carbohydrazide perchlorates (MCPs). The research found that crystalline MCPs with larger electronic band gaps exhibit lower impact sensitivity, while the friction sensitivity is determined by the strength of intermolecular interactions. Additionally, the decomposition process of MCPs consists of two stages: nonspontaneous departure of the CHZ groups and spontaneous exoergic decomposition pathways triggered by the transfer of O/H radicals.
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
(2022)
Article
Chemistry, Multidisciplinary
Evgeny Mikheev, Tino Zimmerling, Amelia Estry, Philip J. W. Moll, David Goldhaber-Gordon
Summary: In this work, two previously incompatible techniques are combined to define electronic devices. By using focused ion beam (FIB) to shape three-dimensional crystals and two-dimensional electrostatic accumulation of charge carriers, a sacrificial protective layer is used to preserve the surface quality. The accumulation of charge carriers using ionic liquid gating demonstrates the superconductivity of the accumulated carriers, and this technique opens new possibilities for electrostatic charge tuning in materials.
Article
Chemistry, Inorganic & Nuclear
Pablo Orus, Fabian Sigloch, Soraya Sangiao, Jose Maria De Teresa
Summary: Ga+ Focused Ion Beam Induced Deposition (FIBID) is a nanopatterning technique that utilizes a focused beam of Ga+ ions to locally induce the decomposition of a gaseous precursor material. By stacking individual patterns, growth along the vertical direction can be achieved, resulting in nanopillars with heights up to 10 μm and potential applications in the design of 3D superconducting devices.
JOURNAL OF SOLID STATE CHEMISTRY
(2022)
Article
Materials Science, Multidisciplinary
Hojun Lim, Jay D. Carroll, Joseph R. Michael, Corbett C. Battaile, Shuh Rong Chen, J. Matthew D. Lane
Article
Engineering, Mechanical
Nathan M. Heckman, Henry A. Padilla, Joseph R. Michael, Christopher M. Barr, Blythe G. Clark, Khalid Hattar, Brad L. Boyce
INTERNATIONAL JOURNAL OF FATIGUE
(2020)
Article
Materials Science, Multidisciplinary
Joshua D. Sugar, Joseph T. McKeown, Dhego Banga, Joseph R. Michael
MICROSCOPY AND MICROANALYSIS
(2020)
Article
Engineering, Mechanical
S. Prasad, J. R. Michael, C. C. Battaile, B. S. Majumdar, P. G. Kotula
Article
Nanoscience & Nanotechnology
Peter A. Sharma, Taisuke Ohta, Michael T. Brumbach, Joshua D. Sugar, Joseph Michael
Summary: PEEM was used to investigate the surfaces of textured polycrystalline N-type bismuth telluride and P-type antimony telluride materials, showing changes in work function with exposure to air and the formation of oxide layers. The observed work function contrast is attributed to the pinning of electronic surface states due to defects at grain boundaries.
ACS APPLIED MATERIALS & INTERFACES
(2021)
Article
Materials Science, Multidisciplinary
Timothy J. Ruggles, Julia Deitz, Andrew A. Allerman, C. Barry Carter, Joseph R. Michael
Summary: This study characterizes novel star defects in GaN films grown with metal-organic vapor phase deposition (MOVPE) on GaN substrates using electron channeling contrast imaging (ECCI) and high-resolution electron backscatter diffraction (HREBSD). These defects, hundreds of microns in size, tend to aggregate threading dislocations at their centers. They are the intersection of six nearly ideal low-angle tilt boundaries composed of -type pyramidal edge dislocations, each on a unique slip system.
MICROSCOPY AND MICROANALYSIS
(2021)
Article
Materials Science, Multidisciplinary
D. F. Susan, A. B. Kustas, R. A. Kellogg, J. D. Carroll, J. R. Michael, I Karaman
Summary: Equal channel angular extrusion (ECAE) greatly enhances the strength and ductility of the alloy 49Fe-49Co-2V, known as Hiperco (R) 50A or Permendur-2V, at the expense of soft magnetic performance. Post-ECAE annealing above 650 degrees C leads to a steep decline in yield strength due to grain growth and the Hall-Petch effect, while also improving soft magnetic behavior. Overall, there is a definitive tradeoff between mechanical and magnetic properties brought about by post-ECAE annealing and grain growth.
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE
(2021)
Article
Materials Science, Multidisciplinary
Joseph R. Michael, Lucille A. Giannuzzi, M. Grace Burke, Xiang Li Zhong
Summary: The transformation of unstable austenite to ferrite or alpha' martensite in a 304 stainless steel casting alloy due to Xe+ or Ga+ ion exposure at room temperature was investigated. Both Ga+ and Xe+ ion irradiation resulted in the transformation, and the crystallographic orientation of the transformed area was consistent with established orientation relationships.
MICROSCOPY AND MICROANALYSIS
(2022)
Book Review
Materials Science, Multidisciplinary
Joseph R. Michael
JOURNAL OF MATERIALS SCIENCE
(2022)
Article
Materials Science, Coatings & Films
Morgann Berg, Sean W. Smith, David A. Scrymgeour, Michael T. Brumbach, Ping Lu, Sara M. Dickens, Joseph R. Michael, Taisuke Ohta, Ezra Bussmann, Harold P. Hjalmarson, Peter A. Schultz, Paul G. Clem, Matthew M. Hopkins, Christopher H. Moore
Summary: Structural disorder leads to spatial variation in the surface electronic properties of materials. For polycrystalline Pt, nanoscale resolution photoemission threshold mapping reveals a significant spatial variation in the work function (phi) distribution, which has implications for field emission and related phenomena.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
(2022)
Article
Materials Science, Multidisciplinary
Joseph R. Michael, Daniel L. Perry, Damion P. Cummings, Jeremy A. Walraven, Matthew B. Jordan
Summary: This paper investigates the metallurgy of indium interconnects and finds that the use of ion beam preparation may lead to artifacts. By modifying the milling strategies and cooling the samples, accurate cross-sections can be obtained.
MICROSCOPY AND MICROANALYSIS
(2022)
Article
Materials Science, Multidisciplinary
Julia Deitz, Timothy J. Ruggles, Philip J. Noell, Donald F. Susan, Andrew B. Kustas, Paul G. Kotula, Joseph R. Michael
Summary: Heat-treated FeCo-based magnetic alloys were characterized using electron microscopy techniques. Unique grains with nonuniform background contrast were found on the outer edge of a FeCo sample using electron channeling contrast imaging (ECCI) in the scanning electron microscope (SEM). High-resolution electron backscattered diffraction (HR-EBSD) confirmed these grains to have defect structures and subgrain boundaries. ECCI can be used as a rapid method to quantify unrecrystallized grains. Micro indentation experiments showed that dislocation networks in these grains act as a barrier to plastic deformation.
MICROSCOPY AND MICROANALYSIS
(2023)
Article
Materials Science, Multidisciplinary
Timothy Ruggles, Scott Grutzik, Kelly Stephens, Joseph Michael
Summary: This study found that in legacy components that had no obvious voids, the stresses were comparable to the theoretical stresses at the time of manufacture (approximately 300 MPa). Distortion fields in the substrate were also determined around known voids, which may be directly compared to stress voiding models. The technique presented here for stress determination, HREBSD coupled with finite element analysis to infer subsurface stresses, is a valuable tool for assessing failure in layered microelectronics devices.
MICROSCOPY AND MICROANALYSIS
(2023)
Article
Materials Science, Multidisciplinary
S. R. Ellis, N. C. Bartelt, F. Leonard, K. C. Celio, E. J. Fuller, D. R. Hughart, D. Garland, M. J. Marinella, J. R. Michael, D. W. Chandler, B. Liao, A. A. Talin
Summary: Understanding and controlling the interaction of charge carriers with defects at buried insulator/semiconductor interfaces is crucial for optimal performance in electronics. This study used scanning ultrafast electron microscopy (SUEM) to investigate the dynamics of excited carriers at a Si surface buried under a thick oxide layer, revealing a previously unidentified contrast mechanism. Analysis of the contrast as a function of time and laser fluence demonstrated diffusion-mediated capture of excited carriers by interfacial traps.
Article
Materials Science, Multidisciplinary
Tomas F. Babuska, Mark A. Wilson, Kyle L. Johnson, Shaun R. Whetten, John F. Curry, Jeffrey M. Rodelas, Cooper Atkinson, Ping Lu, Michael Chandross, Brandon A. Krick, Joseph R. Michael, Nicolas Argibay, Donald F. Susan, Andrew B. Kustas