Secondary Electron Intensity Contrast Imaging and Friction Properties of Micromechanically Cleaved Graphene Layers on Insulating Substrates

Title
Secondary Electron Intensity Contrast Imaging and Friction Properties of Micromechanically Cleaved Graphene Layers on Insulating Substrates
Authors
Keywords
Graphene, micromechanical cleavage, atomic force microscopy, scanning electron microscopy, work function, friction coefficient, Raman mapping, HRTEM, SAED
Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 43, Issue 9, Pages 3458-3469
Publisher
Springer Nature
Online
2014-07-02
DOI
10.1007/s11664-014-3277-0

Ask authors/readers for more resources

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started