Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials

Title
Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials
Authors
Keywords
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Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 41, Issue 6, Pages 1667-1674
Publisher
Springer Nature
Online
2012-04-03
DOI
10.1007/s11664-012-2039-0

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