Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials

标题
Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials
作者
关键词
-
出版物
JOURNAL OF ELECTRONIC MATERIALS
Volume 41, Issue 6, Pages 1667-1674
出版商
Springer Nature
发表日期
2012-04-03
DOI
10.1007/s11664-012-2039-0

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