Quantitative and Depth-Resolved Investigation of Deep-Level Defects in InGaN/GaN Heterostructures

Published 2010 View Full Article

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Title
Quantitative and Depth-Resolved Investigation of Deep-Level Defects in InGaN/GaN Heterostructures
Authors
Keywords
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Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 40, Issue 4, Pages 369-376
Publisher
Springer Nature
Online
2010-12-24
DOI
10.1007/s11664-010-1453-4
References
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