Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun

A Dopant Cluster in a Highly Antimony Doped Silicon Crystal

(2010) Suhyun Kim et al.   Applied Physics Express

Visualization of Tm dopant atoms diffused out of GaN quantum dots

(2010) H. Okuno et al.   APPLIED PHYSICS LETTERS

Detection of arsenic dopant atoms in a silicon crystal using a spherical aberration corrected scanning transmission electron microscope

(2010) Y. Oshima et al.   PHYSICAL REVIEW B

Oxygen-rich Ti1−xO2 pillar growth at a gold nanoparticle–TiO2 contact by O2 exposure

(2010) Takayuki Tanaka et al.   SURFACE SCIENCE

Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy

(2010) Yoshifumi Oshima et al.   Microscopy

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

(2009) H. Sawada et al.   Microscopy

Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images

(2009) James M. LeBeau et al.   PHYSICAL REVIEW B

High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment

(2009) James M. LeBeau et al.   PHYSICAL REVIEW B

Quantitative Atomic Resolution Scanning Transmission Electron Microscopy

(2008) James M. LeBeau et al.   PHYSICAL REVIEW LETTERS