STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

(2009) Rolf Erni et al.   PHYSICAL REVIEW LETTERS

Object-defined Resolution Below 0.5Å in Transmission Electron Microscopy - Recent Advances on the TEAM 0.5 Instrument

(2008) C Kisielowski et al.   MICROSCOPY AND MICROANALYSIS

Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope

(2008) S Sawada et al.   MICROSCOPY AND MICROANALYSIS

Performance Advantages of a Modern, Ultra-High Mass Resolution Atom Probe

(2008) P Clifton et al.   MICROSCOPY AND MICROANALYSIS

Studying Atomic Structures by Aberration-Corrected Transmission Electron Microscopy

(2008) K. W. Urban   SCIENCE

Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

(2008) D. A. Muller et al.   SCIENCE