In-situ XPS and RHEED study of gallium oxide on GaAs deposition by molecular beam epitaxy

Title
In-situ XPS and RHEED study of gallium oxide on GaAs deposition by molecular beam epitaxy
Authors
Keywords
-
Journal
JOURNAL OF CRYSTAL GROWTH
Volume 323, Issue 1, Pages 103-106
Publisher
Elsevier BV
Online
2010-11-26
DOI
10.1016/j.jcrysgro.2010.11.122

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now