In-situ XPS and RHEED study of gallium oxide on GaAs deposition by molecular beam epitaxy

标题
In-situ XPS and RHEED study of gallium oxide on GaAs deposition by molecular beam epitaxy
作者
关键词
-
出版物
JOURNAL OF CRYSTAL GROWTH
Volume 323, Issue 1, Pages 103-106
出版商
Elsevier BV
发表日期
2010-11-26
DOI
10.1016/j.jcrysgro.2010.11.122

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