Assessment of defect reduction methods for nonpolar a-plane GaN grown on r-plane sapphire

Published 2009 View Full Article

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Title
Assessment of defect reduction methods for nonpolar a-plane GaN grown on r-plane sapphire
Authors
Keywords
-
Journal
JOURNAL OF CRYSTAL GROWTH
Volume 311, Issue 12, Pages 3295-3299
Publisher
Elsevier BV
Online
2009-04-07
DOI
10.1016/j.jcrysgro.2009.03.044

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