Electric force microscopy of semiconductors: Theory of cantilever frequency fluctuations and noncontact friction
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Title
Electric force microscopy of semiconductors: Theory of cantilever frequency fluctuations and noncontact friction
Authors
Keywords
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Journal
JOURNAL OF CHEMICAL PHYSICS
Volume 139, Issue 18, Pages 184702
Publisher
AIP Publishing
Online
2013-11-09
DOI
10.1063/1.4828862
References
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