Phosphorus doping of Si nanocrystals embedded in silicon oxynitride determined by atom probe tomography

Efficient n-type doping of Si nanocrystals embedded in SiO2 by ion beam synthesis

(2013) Rim Khelifi et al.   APPLIED PHYSICS LETTERS

Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica

(2013) Etienne Talbot et al.   Nanoscale Research Letters

Atom Probe Tomography 2012

(2012) Thomas F. Kelly et al.   Annual Review of Materials Research

Doping efficiency of phosphorus doped silicon nanocrystals embedded in a SiO2 matrix

(2012) S. Gutsch et al.   APPLIED PHYSICS LETTERS

Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography

(2012) Satyanarayana V N T Kuchibhatla et al.   NANOTECHNOLOGY

Three-Dimensional Spatial Distribution of Cr atoms in Doped Indium Oxide

(2011) David J. Payne et al.   CHEMISTRY OF MATERIALS

In-situ observation of non-hemispherical tip shape formation during laser-assisted atom probe tomography

(2011) S. Koelling et al.   JOURNAL OF APPLIED PHYSICS

Evidence of Superparamagnetic Co Clusters in Pulsed Laser Deposition-Grown Zn0.9Co0.1O Thin Films Using Atom Probe Tomography

(2011) Rodrigue Lardé et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Formation of size-controlled silicon nanocrystals in plasma enhanced chemical vapor deposition grown SiOxNy/SiO2 superlattices

(2011) A.M. Hartel et al.   THIN SOLID FILMS

Pragmatic reconstruction methods in atom probe tomography

(2011) F. Vurpillot et al.   ULTRAMICROSCOPY

Spatial Resolution in Atom Probe Tomography

(2010) Baptiste Gault et al.   MICROSCOPY AND MICROANALYSIS

On the Field Evaporation Behavior of Dielectric Materials in Three-Dimensional Atom Probe: A Numeric Simulation

(2010) Christian Oberdorfer et al.   MICROSCOPY AND MICROANALYSIS

Advances in the reconstruction of atom probe tomography data

(2010) B. Gault et al.   ULTRAMICROSCOPY

Quantitative atom probe analysis of nanostructure containing clusters and precipitates with multiple length scales

(2010) R.K.W. Marceau et al.   ULTRAMICROSCOPY

A sensitivity analysis of the maximum separation method for the characterisation of solute clusters

(2010) J.M. Hyde et al.   ULTRAMICROSCOPY

Si nanoparticles in SiO2An atomic scale observation for optimization of optical devices

(2009) E. Talbot et al.   EPL

Doping efficiency in freestanding silicon nanocrystals from the gas phase: Phosphorus incorporation and defect-induced compensation

(2009) A. R. Stegner et al.   PHYSICAL REVIEW B

Dielectric screening versus quantum confinement of phosphorus donors in silicon nanocrystals investigated by magnetic resonance

(2009) R. N. Pereira et al.   PHYSICAL REVIEW B

Clustering and nearest neighbour distances in atom-probe tomography

(2009) T. Philippe et al.   ULTRAMICROSCOPY

Doping efficiency, dopant location, and oxidation of Si nanocrystals

(2008) X. D. Pi et al.   APPLIED PHYSICS LETTERS

Chromatic Aberrations in the Field Evaporation Behavior of Small Precipitates

(2008) Emmanuelle A. Marquis et al.   MICROSCOPY AND MICROANALYSIS

Size Limits on Doping Phosphorus into Silicon Nanocrystals

(2007) T.-L. Chan et al.   NANO LETTERS

Selective energy contacts for hot carrier solar cells

(2007) G.J. Conibeer et al.   THIN SOLID FILMS