Effect of embedded metal nanocrystals on the resistive switching characteristics in NiN-based resistive random access memory cells

Impact of Electroforming Current on Self-Compliance Resistive Switching in an ${\rm ITO}/{\rm Gd{:}SiO}_{\rm x}/{\rm TiN}$ Structure

(2013) Hsueh-Chih Tseng et al.   IEEE ELECTRON DEVICE LETTERS

Cu-Embedded AlN-Based Nonpolar Nonvolatile Resistive Switching Memory

(2012) Chao Chen et al.   IEEE ELECTRON DEVICE LETTERS

Ultrafast Resistive-Switching Phenomena Observed in NiN-Based ReRAM Cells

(2012) Hee-Dong Kim et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Robust unipolar resistive switching of Co nano-dots embedded ZrO2 thin film memories and their switching mechanism

(2012) Ming-Chi Wu et al.   JOURNAL OF APPLIED PHYSICS

Size effects of metal nanoparticles embedded in a buffer layer of organic photovoltaics on plasmonic absorption enhancement

(2012) Inho Kim et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Resistive switching characteristics of a Pt nanoparticle-embedded SiO2-based memory

(2012) Chih-Yi Liu et al.   THIN SOLID FILMS

Enhancement of Resistive Switching Characteristics in $ \hbox{Al}_{2}\hbox{O}_{3}$-Based RRAM With Embedded Ruthenium Nanocrystals

(2011) Lin Chen et al.   IEEE ELECTRON DEVICE LETTERS

Forming-free resistive switching behaviors in Cr-embedded Ga2O3 thin film memories

(2011) Dai-Ying Lee et al.   JOURNAL OF APPLIED PHYSICS

Effects of Ti top electrode thickness on the resistive switching behaviors of rf-sputtered ZrO2 memory films

(2009) Sheng-Yu Wang et al.   APPLIED PHYSICS LETTERS

Hysteretic bipolar resistive switching characteristics in TiO2/TiO2−x multilayer homojunctions

(2009) Young Ho Do et al.   APPLIED PHYSICS LETTERS

Critical thickness for the agglomeration of thin metal films

(2009) C. Boragno et al.   PHYSICAL REVIEW B

Improvement of Resistive Switching Characteristics in $\hbox{SrZrO}_{3}$ Thin Films With Embedded Cr Layer

(2008) Chih-Yang Lin et al.   IEEE ELECTRON DEVICE LETTERS

Comparative structural and electrical analysis of NiO and Ti doped NiO as materials for resistance random access memory

(2008) M. J. Lee et al.   JOURNAL OF APPLIED PHYSICS

Effect of thermal treatment on resistive switching characteristics in Pt/Ti/Al2O3/Pt devices

(2008) Chih-Yang Lin et al.   SURFACE & COATINGS TECHNOLOGY