Comparative structural and electrical analysis of NiO and Ti doped NiO as materials for resistance random access memory

Published 2008 View Full Article

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Title
Comparative structural and electrical analysis of NiO and Ti doped NiO as materials for resistance random access memory
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 103, Issue 1, Pages 013706
Publisher
AIP Publishing
Online
2008-01-15
DOI
10.1063/1.2829814

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