Leakage current through the poly-crystalline HfO2: Trap densities at grains and grain boundaries

Charge Transport and Degradation in HfO2 and HfOx Dielectrics

(2013) Andrea Padovani et al.   IEEE ELECTRON DEVICE LETTERS

Correlation between the nanoscale electrical and morphological properties of crystallized hafnium oxide-based metal oxide semiconductor structures

(2011) V. Iglesias et al.   APPLIED PHYSICS LETTERS

Degradation of polycrystalline HfO2-based gate dielectrics under nanoscale electrical stress

(2011) V. Iglesias et al.   APPLIED PHYSICS LETTERS

A Physical Model of the Temperature Dependence of the Current Through $\hbox{SiO}_{2}\hbox{/}\hbox{HfO}_{2}$ Stacks

(2011) L. Vandelli et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Grain boundary-driven leakage path formation in HfO2 dielectrics

(2011) G. Bersuker et al.   SOLID-STATE ELECTRONICS

The interaction of oxygen vacancies with grain boundaries in monoclinic HfO2

(2009) Keith McKenna et al.   APPLIED PHYSICS LETTERS

Resistive switching in transition metal oxides

(2008) Akihito Sawa   Materials Today