Physical mechanisms for hot-electron degradation in GaN light-emitting diodes

Published 2010 View Full Article

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Title
Physical mechanisms for hot-electron degradation in GaN light-emitting diodes
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 107, Issue 7, Pages 073103
Publisher
AIP Publishing
Online
2010-04-06
DOI
10.1063/1.3357312
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