Physical mechanisms for hot-electron degradation in GaN light-emitting diodes

标题
Physical mechanisms for hot-electron degradation in GaN light-emitting diodes
作者
关键词
-
出版物
JOURNAL OF APPLIED PHYSICS
Volume 107, Issue 7, Pages 073103
出版商
AIP Publishing
发表日期
2010-04-06
DOI
10.1063/1.3357312

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