Atomic scale characterization of buried InxGa1−xAs quantum dots using pulsed laser atom probe tomography

Title
Atomic scale characterization of buried InxGa1−xAs quantum dots using pulsed laser atom probe tomography
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 23, Pages 233115
Publisher
AIP Publishing
Online
2008-06-14
DOI
10.1063/1.2918846

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