A small/wide-angle X-ray scattering instrument for structural characterization of air–liquid interfaces, thin films and bulk specimens

Published 2009 View Full Article

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Title
A small/wide-angle X-ray scattering instrument for structural characterization of air–liquid interfaces, thin films and bulk specimens
Authors
Keywords
-
Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 43, Issue 1, Pages 110-121
Publisher
International Union of Crystallography (IUCr)
Online
2009-11-30
DOI
10.1107/s0021889809043271

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