A small/wide-angle X-ray scattering instrument for structural characterization of air–liquid interfaces, thin films and bulk specimens

标题
A small/wide-angle X-ray scattering instrument for structural characterization of air–liquid interfaces, thin films and bulk specimens
作者
关键词
-
出版物
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 43, Issue 1, Pages 110-121
出版商
International Union of Crystallography (IUCr)
发表日期
2009-11-30
DOI
10.1107/s0021889809043271

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