Management of metadata and automation for mail-in measurements with the APS 11-BM high-throughput, high-resolution synchrotron powder diffractometer

Title
Management of metadata and automation for mail-in measurements with the APS 11-BM high-throughput, high-resolution synchrotron powder diffractometer
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 42, Issue 6, Pages 990-993
Publisher
International Union of Crystallography (IUCr)
Online
2009-10-14
DOI
10.1107/s0021889809035717

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