Management of metadata and automation for mail-in measurements with the APS 11-BM high-throughput, high-resolution synchrotron powder diffractometer

标题
Management of metadata and automation for mail-in measurements with the APS 11-BM high-throughput, high-resolution synchrotron powder diffractometer
作者
关键词
-
出版物
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 42, Issue 6, Pages 990-993
出版商
International Union of Crystallography (IUCr)
发表日期
2009-10-14
DOI
10.1107/s0021889809035717

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started