A phase-field study of the scaling law in free-standing ferroelectric thin films

Published 2015 View Full Article

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Title
A phase-field study of the scaling law in free-standing ferroelectric thin films
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 26, Issue 50, Pages 505701
Publisher
IOP Publishing
Online
2015-11-18
DOI
10.1088/0957-4484/26/50/505701

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