A phase-field study of the scaling law in free-standing ferroelectric thin films

标题
A phase-field study of the scaling law in free-standing ferroelectric thin films
作者
关键词
-
出版物
NANOTECHNOLOGY
Volume 26, Issue 50, Pages 505701
出版商
IOP Publishing
发表日期
2015-11-18
DOI
10.1088/0957-4484/26/50/505701

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