Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy

Published 2015 View Full Article

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Title
Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 26, Issue 34, Pages 345702
Publisher
IOP Publishing
Online
2015-08-05
DOI
10.1088/0957-4484/26/34/345702

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