Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy

出版年份 2015 全文链接

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作者

关键词

出版物

Volume 26, Issue 34, Pages 345702

出版商

IOP Publishing

发表日期

2015-08-05

DOI

10.1088/0957-4484/26/34/345702

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