Investigation of Line Width Narrowing and Spectral Jumps of Single Stable Defect Centers in ZnO at Cryogenic Temperature

Title
Investigation of Line Width Narrowing and Spectral Jumps of Single Stable Defect Centers in ZnO at Cryogenic Temperature
Authors
Keywords
-
Journal
NANO LETTERS
Volume 15, Issue 5, Pages 3024-3029
Publisher
American Chemical Society (ACS)
Online
2015-03-27
DOI
10.1021/nl504941q

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