Investigation of Line Width Narrowing and Spectral Jumps of Single Stable Defect Centers in ZnO at Cryogenic Temperature

标题
Investigation of Line Width Narrowing and Spectral Jumps of Single Stable Defect Centers in ZnO at Cryogenic Temperature
作者
关键词
-
出版物
NANO LETTERS
Volume 15, Issue 5, Pages 3024-3029
出版商
American Chemical Society (ACS)
发表日期
2015-03-27
DOI
10.1021/nl504941q

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