Electrostatic Properties of Organic Monolayers on Silicon Oxides Studied by Kelvin Probe Force Microscopy

Title
Electrostatic Properties of Organic Monolayers on Silicon Oxides Studied by Kelvin Probe Force Microscopy
Authors
Keywords
-
Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 51, Issue -, Pages 045702
Publisher
Japan Society of Applied Physics
Online
2012-04-17
DOI
10.1143/jjap.51.045702

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