Electrostatic Properties of Organic Monolayers on Silicon Oxides Studied by Kelvin Probe Force Microscopy

标题
Electrostatic Properties of Organic Monolayers on Silicon Oxides Studied by Kelvin Probe Force Microscopy
作者
关键词
-
出版物
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 51, Issue -, Pages 045702
出版商
Japan Society of Applied Physics
发表日期
2012-04-17
DOI
10.1143/jjap.51.045702

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