Aberration-corrected scanning transmission electron microscopy for atomic-resolution studies of functional oxides

Title
Aberration-corrected scanning transmission electron microscopy for atomic-resolution studies of functional oxides
Authors
Keywords
-
Journal
INTERNATIONAL MATERIALS REVIEWS
Volume 59, Issue 3, Pages 115-131
Publisher
Informa UK Limited
Online
2014-03-13
DOI
10.1179/1743280413y.0000000026

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